AFM probe

Results: 89



#Item
713rd Tri-National Workshop on Standards for Nanotechnology  Documentary Standards Activity for Scanned Probe Microscopy: ISO TC201/SC9 and SG3: Guidelines for Image/Artifact

3rd Tri-National Workshop on Standards for Nanotechnology Documentary Standards Activity for Scanned Probe Microscopy: ISO TC201/SC9 and SG3: Guidelines for Image/Artifact

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Source URL: www.cenam.mx

Language: English - Date: 2009-02-23 18:16:44
72Be a Scanning Probe Microscope Provided by TryEngineering - www.tryengineering.org Lesson Focus

Be a Scanning Probe Microscope Provided by TryEngineering - www.tryengineering.org Lesson Focus

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Source URL: www.tryengineering.org

Language: English - Date: 2012-06-20 11:13:17
73APPLICATION OF AN INVERSE-HYSTERESIS ITERATIVE CONTROL ALGORITHM FOR AFM FABRICATION A thesis submitted in partial fulfillment of the requirements for the degree of Master of Science in Mechanical and Nuclear Engineering

APPLICATION OF AN INVERSE-HYSTERESIS ITERATIVE CONTROL ALGORITHM FOR AFM FABRICATION A thesis submitted in partial fulfillment of the requirements for the degree of Master of Science in Mechanical and Nuclear Engineering

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Source URL: www.kam.k.leang.com

Language: English - Date: 2012-04-05 18:18:52
74ADVANCED MATERIALS AFM-Based Nanomechanics Objective Local mechanical-property information is essential to evaluate emerging micro- and nanoscale materials, which many manufacturers would like to leverage for their uniqu

ADVANCED MATERIALS AFM-Based Nanomechanics Objective Local mechanical-property information is essential to evaluate emerging micro- and nanoscale materials, which many manufacturers would like to leverage for their uniqu

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Source URL: www.nist.gov

Language: English - Date: 2013-01-31 16:00:47
75

PDF Document

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Source URL: media.wiley.com

Language: English - Date: 2013-10-17 07:17:58
76NN  NaugaNeedles NaugaNeedles

NN NaugaNeedles NaugaNeedles

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Source URL: nauganeedles.com

Language: English - Date: 2012-10-03 11:12:31
77SPM略語表 略号 AFM BEEM CFM CITS

SPM略語表 略号 AFM BEEM CFM CITS

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Source URL: www.jpo.go.jp

Language: English - Date: 2014-03-12 23:19:15
78Planar AFM Piezo Scanner Stages & Controllers Piezo Systems, Parallel Kinematics, Low Bow, Single Module Planar for P

Planar AFM Piezo Scanner Stages & Controllers Piezo Systems, Parallel Kinematics, Low Bow, Single Module Planar for P

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Source URL: www.piezo.ws

Language: English - Date: 2011-03-10 09:12:43
79Bruker AFM Technology Continues to Break New Ground in Advanced Research

Bruker AFM Technology Continues to Break New Ground in Advanced Research

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Source URL: www.bruker.com

Language: English - Date: 2014-03-26 20:13:29
80Microsoft PowerPoint - sciGL_AFM_flyer_0.ppt

Microsoft PowerPoint - sciGL_AFM_flyer_0.ppt

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Source URL: www.sciencegl.com

Language: English - Date: 2007-01-20 17:43:02